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Laboratório de Implantação Iônica - Universidade Federal do Rio Grande do Sul (UFRGS)

• 2019
• M. Vos and P. L. Grande, “Extension schemes of the dielectric function, and their implications for ion stopping calculations,” J. Phys. Chem. Solids, 2019. / Ver detalhes

• J. Gonzalez et al., “Elemental Concentration and Sulfur Chemical Speciation in the Amazonian Plant Andira surinamensis Using Synchrotron Radiation Techniques (SR-XRF, XANES), RBS and WD-XRF,” J. Braz. Chem. Soc., 2019. / Ver detalhes

• H. Trombini et al., “Profiling As plasma doped Si/SiO2 with molecular ions,” Thin Solid Films, vol. 692, p. 137536, Dec. 2019. / Ver detalhes

• M. C. da S. Goersch et al., “Nutritional composition of Eragrostis teff and its association with the observed antimutagenic effects,” RSC Adv., vol. 9, no. 7, pp. 3764–3776, 2019. / Ver detalhes

• J. Ruiz-Fuertes, J. Ibáñez, V. Monteseguro, I. Alencar, and C. Cazorla, “Reversible Tuning of Ca Nanoparticles Embedded in a Superionic CaF2 Matrix,” J. Phys. Chem. C, vol. 123, no. 32, pp. 19945–19951, Aug. 2019. / Ver detalhes

• C. E. dos Santos et al., “The influence of the winemaking process on the elemental composition of the Marselan red wine,” J. Sci. Food Agric., vol. 99, no. 10, pp. 4642–4650, Aug. 2019. / Ver detalhes

• Gabriela Copetti, PhD (2019), “Halogenação de Materiais 2D”. PPGFis, UFRGS, Supervisor: Claudio Radtke. / Ver detalhes

• Henrique Trombini, PhD (2019), “Versatilidade da técnica MEIS na caracterização de nanomateriais e dispositivos avançados” (“The versatility of the MEIS technique in the characterization of nanomaterials and advanced devices”). Orientador: Prof. Dr. Pedro Luis Grande. Data: 28/11/2019 / Ver detalhes

• C. A. Bolzan, D. J. Manzo, A. M. H. de Andrade, J. R. Schoffen, and R. Giulian, “Characterization of polycrystalline In(y)Al(x)Sb(1-x-y) films deposited by magnetron sputtering,” Thin Solid Films, vol. 692, p. 137630, Dec. 2019. / Ver detalhes

• E. Ribas, H. Boudinov, and R. L. Maltez, “Ion beam synthesis of SiC on Si toward the radiation damage free limit,” Nucl. Instruments Methods Phys. Res. Sect. B Beam Interact. with Mater. Atoms, vol. 445, pp. 34–40, Apr. 2019. / Ver detalhes