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Artigos e Patentes

Laboratório de Implantação Iônica - Universidade Federal do Rio Grande do Sul (UFRGS)

• 2019
• O. de Melo et al., “Modeling and growth of graded composition interdiffused multilayers in the CdTe-ZnTe system,” Mater. Sci. Semicond. Process., vol. 97, pp. 17–20, Jul. 2019. / Ver detalhes

• R. S. R. Almeida, M. M. Taccini, L. F. de Moura, U. L. Ceribelli, J. O. Brito, and E. M. Gloria, “Potential of Pyroligneous Extract of Eucalyptus Wood as a Preservative of Cosmetic and Sanitizing Products,” Waste and Biomass Valorization, vol. 10, no. 5, pp. 1111–1118, May 2019. / Ver detalhes

• E. Pitthan, E. R. F. Gerling, T. O. Feijó, C. Radtke, and G. V. Soares, “Annealing Response of Monolayer MoS2 Grown by Chemical Vapor Deposition,” ECS J. Solid State Sci. Technol., vol. 8, no. 4, pp. P267–P270, May 2019. / Ver detalhes

• R. Debastiani et al., “Elemental analysis of Brazilian coffee with ion beam techniques: From ground coffee to the final beverage,” Food Res. Int., vol. 119, pp. 297–304, May 2019. / Ver detalhes

• E. Pitthan et al., “Chemical state of phosphorous at the SiC/SiO2 interface,” Thin Solid Films, vol. 675, pp. 172–176, Apr. 2019. / Ver detalhes

• T. Figueiredo et al., “Understanding the Strong Metal–Support Interaction (SMSI) Effect in Cu x Ni 1– x /CeO2 (0 < x < 1) Nanoparticles for Enhanced Catalysis,” ACS Appl. Nano Mater., vol. 2, no. 4, pp. 2559–2573, Apr. 2019. / Ver detalhes

• H. Coelho-Júnior and R. L. Maltez, “RBS/C and TEM characterization of GaN nanolayer obtained by IBS on (001) GaAs,” Nucl. Instruments Methods Phys. Res. Sect. B Beam Interact. with Mater. Atoms, vol. 445, pp. 1–7, Apr. 2019. / Ver detalhes

• L. Zhang et al., “Raman study of amorphization in nanocrystalline 3C–SiC irradiated with C + and He + ions,” J. Raman Spectrosc., vol. 50, no. 8, pp. 1197–1204, Aug. 2019. / Ver detalhes

• L. P. Etcheverry, H. I. Boudinov, G. Vieira Soares, and C. Radtke, “Combining GeO2 passivation strategies aiming at dielectric layers with superior properties on germanium substrates,” J. Mater. Chem. C, vol. 7, no. 27, pp. 8465–8470, 2019. / Ver detalhes

• G. V. Leite and H. I. Boudinov, “Contact Resistance Effects in Ni Drain-Source P3HT/PVA OFETs,” J. Electron. Mater., vol. 48, no. 2, pp. 1268-1275, Feb. 2019. / Ver detalhes